View EntryDate of entry : 08/11/2010


Modulated structure of an 800 A epitactic film of the superconductor
Bi2Sr2CaCu2O8 as studied by synchrotron radiation.

Lee, P.; Graafsma, H.; Gao, Y.; Sheu, H.S.; Coppens, P.; Golden, S.J.; Lange, F.F. Acta Cryst. A 47 57 - 59 (1991)

[ B-IncStrDB ID: 352ENpKT7 ]
 
Submitted by : System [B-IncStrDB]CIF File

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Bi2Sr2_MOD

Chemical Properties

Structural Formula Sum: Bi2.23 Ca0.87 Cu2 O8 Sr1.55   [Help]
Structural Formula: Bi2 Sr2 Ca Cu2 O8   [Help]
Weight: 891.8 Daltons  [Help]

Crystallographic Properties

Exp. Crystal Type of Struc.: mod   [Help]
a: 5.42(1) Å  [Help]
b: 5.409(2) Å  [Help]
c: 30.76(1) Å  [Help]
α: 90 °  [Help]
β: 90 °  [Help]
γ: 90 °  [Help]
Volume: 901.8(5) Å3  [Help]
Crystal System: orthorhombic   [Help]
Space Group Name (H-M): A 2 a a   [Help]
Space Group Name: X2aa(α00)000   [Help]
Number of Formula Units: 4   [Help]

  •  Additional Crystal Information   

Experimental Data

Absorption_coeff_μ: 80.66 &mm;  [Help]
Experimental Special Details:
Sample: thin film (average thickness 800\%A). Twinned sample: 2 domains.
Wave vector estimated from:
1) Petricek, Gao, Lee & Coppens
Phys. Rev. (1990) B42, 387-392
2) Gao, Coppens, Cox & Moodenbaugh
Acta Cryst. (1993) A49, 141-148
  [Help]

Intensity Measure Temperature: 293 K  [Help]
Radiation Wavelength: 1.4 Å  [Help]
Radiation source: Synchrotron 1.4 ΑA   [Help]
Max Order of Satellite Reflections: 2   [Help]

  •  Additional Experimental Information   

Refinement Properties

Modulation function desc.: Displacive modulation:Fourier series. Up to 2nd-order harmonics.   [Help]
Structure factors calc. details: Bessel functions   [Help]
# of observed reflections: 419   [Help]
Residual factor for the observed reflns.: 0.117   [Help]
Experimental Special Details:
Sample: thin film (average thickness 800\%A). Twinned sample: 2 domains.
Wave vector estimated from:
1) Petricek, Gao, Lee & Coppens
Phys. Rev. (1990) B42, 387-392
2) Gao, Coppens, Cox & Moodenbaugh
Acta Cryst. (1993) A49, 141-148
  [Help]

Refinement Special Details:
WARNING: The published displacement parameters have been converted to relative
units. The calculated standard uncertainties (s.u.) have been based uniquely on
the published ones without considering the s.u. of any other quantity involved
in such conversion.
  [Help]

  •  Additional Refinement Information   

Diffraction Data

Intensity Measure Temperature: 293 K  [Help]
Radiation source: Synchrotron 1.4 ΑA   [Help]
Radiation Wavelength: 1.4 Å  [Help]


  •  Reference Structure Information   

  •  Modulation Parameters (Tables)   

  •  Refinement Summary   

  •  Modulation Parameters (Atom Sites Summary)