View EntryDate of entry : 08/11/2010


X-ray investigation of the incommensurate modulated structure of
Bi2.08Sr1.84CuO6-δ.

Leligny, H.; Durcok, S.; Labbe, P.; Ledesert, M.; Raveau, B. Acta Cryst. B 48 407 - 418 (1992)

[ B-IncStrDB ID: 292E132Gb ]
 
Submitted by : System [B-IncStrDB]CIF File

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Bi2.08_MOD

Chemical Properties

Structural Formula Sum: Bi2.076 Cu1 O5.482 Sr1.84   [Help]
Weight: 746.3 Daltons  [Help]

Crystallographic Properties

Exp. Crystal Type of Struc.: mod   [Help]
a: 5.3791(6) Å  [Help]
b: 5.3811(9) Å  [Help]
c: 24.589(3) Å  [Help]
α: 90 °  [Help]
β: 89.93(1) °  [Help]
γ: 90 °  [Help]
Volume: 711.74(17) Å3  [Help]
Crystal System: monoclinic   [Help]
Space Group Name (H-M): A 1 2/a 1   [Help]
Space Group Name: A2/a(α0γ)00   [Help]
Number of Formula Units: 4   [Help]

  •  Additional Crystal Information   

Experimental Data

Absorption_coeff_μ: 119.428 &mm;  [Help]
Intensity Measure Temperature: 294 K  [Help]
Radiation Type: Cu Kα   [Help]
Radiation Wavelength: 1.54178 Å  [Help]
Radiation source: X-ray tube   [Help]
Max Order of Satellite Reflections: 2   [Help]

  •  Additional Experimental Information   

Refinement Properties

Modulation function desc.:
Displacive modulation:Fourier series. Up to 2nd-order harmonics.
Occupational modulation:Fourier series. Up to 2nd-order harmonics.
  [Help]

Structure factors calc. details: Gaussian integration   [Help]
# of observed reflections: 1117   [Help]
Residual factor for the observed reflns.: 0.066   [Help]
factors for all reflns.: 0.075   [Help]
Refinement Special Details:
The incommensurate model includes atomic phason Overhauser factors.

Bi/Sr not reported in published data.

WARNING: The published thermal displacement parameters have been converted to
U,s. The calculated standard uncertainties (s.u.) have been based uniquely on
the published ones without considering the s.u. of any other quantity involved
in such conversion.

WARNING: The published thermal displacement parameters, Biso, have been
converted to Uiso.
  [Help]

  •  Additional Refinement Information   

Diffraction Data

Intensity Measure Temperature: 294 K  [Help]
Radiation source: X-ray tube   [Help]
Radiation Wavelength: 1.54178 Å  [Help]

  •  Additional Diffraction Data Information   


  •  Reference Structure Information   

  •  Modulation Parameters (Tables)   

  •  Refinement Summary   

  •  Modulation Parameters (Atom Sites Summary)